METHOD FOR REDUCING CONTACT DEFECTS IN SEMICONDUCTOR CELLS

Details for Australian Patent Application No. 2003302850 (hide)

Owner ADVANCED MICRO DEVICES, INC.

Inventors HUI, Angela, T.; LI, Wenmei; TU, Amy, C.

Pub. Number AU-A-2003302850

PCT Number PCT/US2003/0299

PCT Pub. Number WO2004/053980

Priority 10/316,569 10.12.02 US

Filing date 24 September 2003

Wipo publication date 30 June 2004

International Classifications

H01L 021/768 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Event Publications

29 July 2004 Complete Application Filed

  Priority application(s): 10/316,569 10.12.02 US

5 August 2004 Application Open to Public Inspection

  Published as AU-A-2003302850

22 September 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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