CIRCUIT PATTERN INSPECTION DEVICE AND CIRCUIT PATTERN INSPECTION METHOD

Details for Australian Patent Application No. 2003302525 (hide)

Owner OHT INC.

Inventors YAMAOKA, Shuji; HAMORI, Hiroshi; ISHIOKA, Shogo

Pub. Number AU-A-2003302525

PCT Number PCT/JP2003/0152

PCT Pub. Number WO2004/051290

Priority 2003-436043 28.11.03 JP; 2002-382813 30.11.02 JP

Filing date 28 November 2003

Wipo publication date 23 June 2004

International Classifications

G01R 031/02 Arrangements for testing electric properties - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection

Event Publications

22 July 2004 Complete Application Filed

  Priority application(s): 2003-436043 28.11.03 JP; 2002-382813 30.11.02 JP

29 July 2004 Application Open to Public Inspection

  Published as AU-A-2003302525

22 September 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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