METHOD FOR TESTING PRECURSOR OF SECONDARY CELL, ITS TESTING INSTRUMENT, AND METHOD FOR MANUFACTURING SECONDARY CELL USING THE METHOD

Details for Australian Patent Application No. 2003255035 (hide)

Owner MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.

Inventors SHIMADA, Mikinari; TANAHASHI, Masakazu; TAKAHASHI, Akira; IMASHUKU, Shouichi; KUME, Toshiro; SHOJI, Masashi; IGAKI, Emiko; TSUTSUMI, Shuji

Pub. Number AU-A-2003255035

PCT Number PCT/JP03/10361

PCT Pub. Number WO2004/021498

Priority 2002-251928 29.08.02 JP

Filing date 14 August 2003

Wipo publication date 19 March 2004

International Classifications

H01M 010/04 Secondary cells - Construction or manufacture in general

H01M 010/40 Secondary cells

Event Publications

30 October 2003 Complete Application Filed

  Priority application(s): 2002-251928 29.08.02 JP

6 May 2004 Application Open to Public Inspection

  Published as AU-A-2003255035

19 May 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

Legal

The information provided by the Site not in the nature of legal or other professional advice. The information provided by the Site is derived from third parties and may contain errors. You must make your own enquiries and seek independent advice from the relevant industry professionals before acting or relying on any information contained herein. Check the above data against the Australian Patent Office AUSPAT database.

Next and Previous Patents/Applications

2003255036-Method of attracting termites

2003255034-METHOD OF FORMING INSULATION FILM ON SEMICONDUCTOR SUBSTRATE