METHOD AND DEVICE FOR DETECTING A BREAKDOWN OF A BIPOLAR TRANSISTOR

Details for Australian Patent Application No. 2003205661 (hide)

Owner INFINEON TECHNOLOGIES AG

Inventors WEBER, Stephan

Pub. Number AU-A-2003205661

PCT Number PCT/EP03/00672

PCT Pub. Number WO2003/069362

Priority 102 05 711.7 12.02.02 DE

Filing date 23 January 2003

Wipo publication date 4 September 2003

International Classifications

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

Event Publications

17 July 2003 Complete Application Filed

  Priority application(s): 102 05 711.7 12.02.02 DE

2 October 2003 Application Open to Public Inspection

  Published as AU-A-2003205661

28 October 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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