Electron microscope with integrated detector(s)
Details for Australian Patent Application No. 2010248074 (hide)
International Classifications
Event Publications
9 February 2012 Section 223 Application Allowed
Aspex Corporation The time in which to enter the National Phase has been extended to 15 Jan 2012. Address for service in Australia - Spruson & Ferguson Level 35 St Martins Tower 31 Market Street Sydney NSW 2000
16 February 2012 PCT application entered the National Phase
PCT publication WO2010/132124 Priority application(s): WO2010/132124
5 July 2012 Assignment before Grant
Aspex Corporation The application has been assigned to FEI Company
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