Electron microscope with integrated detector(s)

Details for Australian Patent Application No. 2010248074 (hide)

Owner Aspex Corporation

Inventors Schamber, Frederick H.; Van Beek, Cornelis G.

Agent Spruson & Ferguson

Pub. Number AU-A-2010248074

PCT Pub. Number WO2010/132124

Priority 61/216,290 15.05.09 US

Filing date 14 May 2010

Wipo publication date 18 November 2010

International Classifications

G01N 23/00 (2006.01) Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. X-rays, neutrons

Event Publications

9 February 2012 Section 223 Application Allowed

  Aspex Corporation The time in which to enter the National Phase has been extended to 15 Jan 2012. Address for service in Australia - Spruson & Ferguson Level 35 St Martins Tower 31 Market Street Sydney NSW 2000

16 February 2012 PCT application entered the National Phase

  PCT publication WO2010/132124 Priority application(s): WO2010/132124

5 July 2012 Assignment before Grant

  Aspex Corporation The application has been assigned to FEI Company

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