Flaw detection testing method

Details for Australian Patent Application No. 2009201801 (hide)

Owner Kabushiki Kaisha Toshiba

Inventors Matsuyama, Koji; Koinuma, Hiroaki

Agent Griffith Hack

Pub. Number AU-B-2009201801

Priority 2008-167610 26.06.08 JP

Filing date 5 May 2009

Wipo publication date 14 January 2010

Acceptance publication date 27 January 2011

International Classifications

G01N 29/04 (2006.01) Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves - Analysing solids

F01D 25/00 (2006.01) Component parts, details, or accessories, not provided for in, or of interest apart from, other groups

G01N 29/44 (2006.01) Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves - Processing the detected response signal

Event Publications

21 May 2009 Complete Application Filed

  Priority application(s): 2008-167610 26.06.08 JP

14 January 2010 Application Open to Public Inspection

  Published as AU-B-2009201801

27 January 2011 Application Accepted

  Published as AU-B-2009201801

26 May 2011 Standard Patent Sealed

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