Microscope enclosure system

Details for Australian Patent Application No. 2007281782 (hide)

Owner Ikonisys, Inc.

Inventors Kim, Youngmin; Tsipouras, Petros; Agarwal, Yash; Tafas, Triantafyllos P.; Guo, Wei; Turgeon, Joseph; Kilpatrick, Michael; Eberle, Richard

Agent Pizzeys

Pub. Number AU-A-2007281782

PCT Pub. Number WO2008/019298

Priority 60/821,544 04.08.06 US

Filing date 2 August 2007

Wipo publication date 14 February 2008

International Classifications

G01R 31/26 (2006.01) Arrangements for testing electric properties - Testing of individual semiconductor devices

G01R 31/28 (2006.01) Arrangements for testing electric properties - Testing of electronic circuits, e.g. by signal tracer

Event Publications

5 March 2009 PCT application entered the National Phase

  PCT publication WO2008/019298 Priority application(s): WO2008/019298

14 January 2010 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(a). A direction to request examination has been given for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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