Method of, and apparatus for, measuring the quality of a surface of a substrate

Details for Australian Patent Application No. 2006352693 (hide)

International Classifications

Event Publications

13 November 2008 PCT application entered the National Phase

PCT publication WO2008/087463 Priority application(s): WO2008/087463

14 June 2012 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

This application lapsed under section 142(2)(d). Examination has been requested or an examination report has issued for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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