Method and system for inspecting indirect bandgap semiconductor structure

Details for Australian Patent Application No. 2006301905 (hide)

Owner BT Imaging Pty Limited

Inventors Trupke, Thorsten; Bardos, Robert Andrew

Agent Shelston IP

Pub. Number AU-A-2006301905

PCT Pub. Number WO2007/041758

Priority 2005905598 11.10.05 AU

Filing date 11 October 2006

Wipo publication date 19 April 2007

International Classifications

G01N 21/64 (2006.01) Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light - Fluorescence

Event Publications

5 June 2008 PCT application entered the National Phase

  PCT publication WO2007/041758 Priority application(s): WO2007/041758

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