Method and system for determining the rate of non uniformity of bolometer based systems

Details for Australian Patent Application No. 2006225967 (hide)

Owner Semi-Conductor Devices - an Elbit Systems - Rafael Partnership

Inventors Bikov, Leonid; Fraenkel, Avraham; Adin, Amnon; Mizrahi, Udi; Kopolovich, Zvi

Agent FB Rice

Pub. Number AU-B-2006225967

PCT Pub. Number WO2006/100663

Priority 167637 24.03.05 IL

Filing date 12 January 2006

Wipo publication date 28 September 2006

Acceptance publication date 22 September 2011

International Classifications

G01J 5/20 (2006.01) Radiation pyrometry - using resistors, thermistors, or semiconductors sensitive to radiation

Event Publications

8 November 2007 PCT application entered the National Phase

  PCT publication WO2006/100663 Priority application(s): WO2006/100663

22 September 2011 Application Accepted

  Published as AU-B-2006225967

19 January 2012 Standard Patent Sealed

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