Simplified quality indicator bit test procedures

Details for Australian Patent Application No. 2006200633 (hide)

Owner Qualcomm Incorporated

Inventors Butsumyo, Vince Ryo; Chen, Tao; Aydin, Levent

Agent Madderns

Pub. Number AU-B-2006200633

Parent 2001296701

Filing date 16 February 2006

Wipo publication date 9 March 2006

Acceptance publication date 25 January 2007

International Classifications

H04B 17/00 (2006.01) Monitoring

Event Publications

2 March 2006 Complete Application Filed

9 March 2006 Application Open to Public Inspection

  Published as AU-B-2006200633

25 January 2007 Application Accepted

  Published as AU-B-2006200633

24 May 2007 Standard Patent Sealed

3 May 2012 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This patent ceased under section 143(a), or Expired. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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