High-resolution, nondestructive imaging of dielectric materials

Details for Australian Patent Application No. 2005271738 (hide)

Owner Little Jr., J.

Inventors Little, Jack R. Jr.

Agent Cullens

Pub. Number AU-B-2005271738

PCT Pub. Number WO2006/017385

Priority 60/598,989 05.08.04 US

Filing date 1 August 2005

Wipo publication date 16 February 2006

Acceptance publication date 19 August 2010

International Classifications

G01R 27/00 (2006.01) Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Event Publications

22 March 2007 PCT application entered the National Phase

  PCT publication WO2006/017385 Priority application(s): WO2006/017385

19 August 2010 Application Accepted

  Published as AU-B-2005271738

16 December 2010 Standard Patent Sealed

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