X-ray inspection apparatus for foreign matter

Details for Australian Patent Application No. 2005201989 (hide)

Owner Takashima Giken Co., Ltd.

Inventors Takashima, Yoshihiko

Agent Phillips Ormonde Fitzpatrick

Pub. Number AU-A-2005201989

Priority 2004-140716 11.05.04 JP

Filing date 10 May 2005

Wipo publication date 1 December 2005

International Classifications

G01N 023/10 Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. X-rays, neutrons

G01N 023/18 Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. X-rays, neutrons

Event Publications

26 May 2005 Complete Application Filed

  Priority application(s): 2004-140716 11.05.04 JP

1 December 2005 Application Open to Public Inspection

  Published as AU-A-2005201989

20 November 2008 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(a). A direction to request examination has been given for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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