Method for deriving calculation equation for calculating coating film irregularity and method for digitizing coating film irregularity

Details for Australian Patent Application No. 2004225645 (hide)

Owner Nippon Paint Co., Ltd.

Inventors Nonogaki, Yoshihiro; Asaba, Takao

Agent Griffith Hack

Pub. Number AU-A-2004225645

PCT Pub. Number WO2004/088293

Priority 2003-096128 31.03.03 JP

Filing date 26 March 2004

Wipo publication date 14 October 2004

Acceptance publication date 17 August 2006

International Classifications

G01N 021/88 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light - Investigating the presence of flaws, defects or contamination

G01J 003/50 Spectrometry - using electric radiation detectors

B05D 003/00 Pretreatment of surfaces to which liquids or other fluent materials are to be applied

Event Publications

3 February 2005 PCT application entered the National Phase

  PCT publication WO2004/088293 Priority application(s): WO2004/088293

17 August 2006 Application Accepted

  Published as AU-A-2004225645

14 December 2006 Standard Patent Sealed

20 October 2011 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This patent ceased under section 143(a), or Expired. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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