NON-DESTRUCTIVE ANALYSIS METHOD FOR DETERMINING THE QUALITY OF A SOLAR CELL, AND APPLICATION OF THE SAME

Details for Australian Patent Application No. 2003301460 (hide)

Owner HAHN-MEITNER-INSTITUT BERLIN GMBH

Inventors SCHEER, Roland; LUCK, Ilka; RUDIGIER, Eveline

Pub. Number AU-A-2003301460

PCT Number PCT/DE2003/0033

PCT Pub. Number WO2004/036656

Priority 102 48 504.6 13.10.02 DE

Filing date 9 October 2003

Wipo publication date 4 May 2004

International Classifications

H01L 031/00 Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation

Event Publications

3 June 2004 Complete Application Filed

  Priority application(s): 102 48 504.6 13.10.02 DE

10 June 2004 Application Open to Public Inspection

  Published as AU-A-2003301460

21 July 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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