METHOD AND APPARATUS FOR MEASURING CHARACTERISTICS OF MATERIALS WITH IMPROVED ACCURACY

Details for Australian Patent Application No. 2003287493 (hide)

Owner MULTIMETRIXS, LLC.

Inventors KESIL, Boris; VELIKOV, Leonid; VOROBYEV, Yuri

Pub. Number AU-A-2003287493

PCT Number PCT/US2003/0350

PCT Pub. Number WO2004/072664

Priority 10/359,378 07.02.03 US; 10/386,648 13.03.03 US

Filing date 3 November 2003

Wipo publication date 6 September 2004

International Classifications

G01R 027/26 Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom - Measuring inductance or capacitance

G01N 027/72 Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means - by investigating magnetic variables

G01B 007/06 Measuring arrangements characterised by the use of electric or magnetic means

Event Publications

1 April 2004 Complete Application Filed

  Priority application(s): 10/359,378 07.02.03 US; 10/386,648 13.03.03 US

7 October 2004 Application Open to Public Inspection

  Published as AU-A-2003287493

27 October 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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