METHOD OF FORMING A THICK STRAINED SILICON LAYER AND SEMICONDUCTOR STRUCTURES INCORPORATING A THICK STRAINED SILICON LAYER

Details for Australian Patent Application No. 2003286810 (hide)

Owner ADVANCED MICRO DEVICES, INC.

Inventors XIANG, Qi; WANG, Haihong; BESSER, Paul, R.; GOO, Jung-Suk; NGO, Minh, Van; PATON, Eric, N.

Pub. Number AU-A-2003286810

PCT Number PCT/US2003/0346

PCT Pub. Number WO2004/061920

Priority 10/335,447 31.12.02 US

Filing date 30 October 2003

Wipo publication date 29 July 2004

International Classifications

H01L 021/20 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Event Publications

1 April 2004 Complete Application Filed

  Priority application(s): 10/335,447 31.12.02 US

2 September 2004 Application Open to Public Inspection

  Published as AU-A-2003286810

15 September 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

Legal

The information provided by the Site not in the nature of legal or other professional advice. The information provided by the Site is derived from third parties and may contain errors. You must make your own enquiries and seek independent advice from the relevant industry professionals before acting or relying on any information contained herein. Check the above data against the Australian Patent Office AUSPAT database.

Next and Previous Patents/Applications

2003286811-Perfume polymeric particles

2003286809-AIR GAP DUAL DAMASCENE PROCESS AND STRUCTURE