METHOD OF CORRECTION AT SAMPLE ANALYSIS, ANALYZER AND ANALYTICAL EQUIPMENT

Details for Australian Patent Application No. 2003275666 (hide)

Owner ARKRAY, INC.

Inventors NAKANO, Hajime; TAGUCHI, Takayuki

Pub. Number AU-A-2003275666

PCT Number PCT/JP03/13669

PCT Pub. Number WO2004/038392

Priority 2002-312960 28.10.02 JP

Filing date 24 October 2003

Wipo publication date 13 May 2004

International Classifications

G01N 021/78 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light

G01N 033/52 Investigating or analysing materials by specific methods not covered by groups -

G01N 031/22 Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroups - using chemical indicators

Event Publications

12 February 2004 Complete Application Filed

  Priority application(s): 2002-312960 28.10.02 JP

17 June 2004 Application Open to Public Inspection

  Published as AU-A-2003275666

14 July 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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