SEMICONDUCTOR TESTING INSTRUMENT TO DETERMINE SAFE OPERATING AREA

Details for Australian Patent Application No. 2003271965 (hide)

International Classifications

Event Publications

22 January 2004 Complete Application Filed

Priority application(s): 0223632.1 11.10.02 GB

3 June 2004 Application Open to Public Inspection

Published as AU-A-2003271965

7 July 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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