A METHOD FOR MEASURING DIFFRACTION PATTERNS FROM A TRANSMISSION ELECTRON MICROSCOPY TO DETERMINE CRYSTAL STRUCTURES AND A DEVICE THEREFOR
Details for Australian Patent Application No. 2003270138 (hide)
International Classifications
Event Publications
15 January 2004 Complete Application Filed
28 April 2005 Application Open to Public Inspection
Published as AU-A-2003270138
18 May 2006 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired
This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.
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