CALIBRATION TECHNIQUE FOR LOCKED LOOP CIRCUIT LEAKAGE CURRENT

Details for Australian Patent Application No. 2003265339 (hide)

Owner SUN MICROSYSTEMS, INC.

Inventors GAUTHIER, Claude, R.; TRIVEDI, Pradeep; AMICK, Brian, W.; LIU, Dean

Pub. Number AU-A-2003265339

PCT Number PCT/US03/24093

PCT Pub. Number WO2004/015868

Priority 10/217,926 13.08.02 US; 10/222,648 16.08.02 US

Filing date 1 August 2003

Wipo publication date 25 February 2004

International Classifications

H03L 007/081 Automatic control of frequency or phase

H03L 007/089 Automatic control of frequency or phase

H03L 007/18 Automatic control of frequency or phase

Event Publications

18 December 2003 Complete Application Filed

  Priority application(s): 10/217,926 13.08.02 US; 10/222,648 16.08.02 US

8 April 2004 Application Open to Public Inspection

  Published as AU-A-2003265339

9 June 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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