METHOD OF COMPARING X-RAY DIFFRACTION PATTERNS USING THE FUNDAMENTAL PARAMETER METHOD

Details for Australian Patent Application No. 2003261380 (hide)

Owner SSCI, INC.

Inventors BATES, Simon; BUGAY, David, E.; STAHLY, Barbara, C.; HALLENBECK, Donald, R.; IVANISEVIC, Igor

Pub. Number AU-A-2003261380

PCT Number PCT/US03/24507

PCT Pub. Number WO2004/013622

Priority 60/401,811 06.08.02 US

Filing date 6 August 2003

Wipo publication date 23 February 2004

International Classifications

G01N 023/205 Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. X-rays, neutrons

Event Publications

20 November 2003 Complete Application Filed

  Priority application(s): 60/401,811 06.08.02 US

1 April 2004 Application Open to Public Inspection

  Published as AU-A-2003261380

2 June 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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