METHOD AND APPARATUS FOR PREDICTING DEVICE ELECTRICAL PARAMETERS DURING FABRICATION

Details for Australian Patent Application No. 2003261127 (hide)

Owner ADVANCED MICRO DEVICES, INC.

Inventors BODE, Christopher, A.; MILLER, Michael, L.

Pub. Number AU-A-2003261127

PCT Number PCT/US03/21287

PCT Pub. Number WO2004/019401

Priority 10/225,638 22.08.02 US

Filing date 9 July 2003

Wipo publication date 11 March 2004

International Classifications

H01L 021/66 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof - Testing or measuring during manufacture or treatment

Event Publications

20 November 2003 Complete Application Filed

  Priority application(s): 10/225,638 22.08.02 US

22 April 2004 Application Open to Public Inspection

  Published as AU-A-2003261127

26 May 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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