METHOD FOR LOCALLY HIGHLY RESOLVED, MASS-SPECTROSCOPIC CHARACTERISATION OF SURFACES USING SCANNING PROBE TECHNOLOGY

Details for Australian Patent Application No. 2003260246 (hide)

Owner JPK INSTRUMENTS AG

Inventors KNEBEL, Detlef; AMREIN, Matthias

Pub. Number AU-A-2003260246

PCT Number PCT/DE03/02493

PCT Pub. Number WO2004/017019

Priority 102 34 507.4 24.07.02 DE

Filing date 24 July 2003

Wipo publication date 3 March 2004

International Classifications

G01B 007/34 Measuring arrangements characterised by the use of electric or magnetic means - for measuring roughness or irregularity of surfaces

G12B 021/00

G01N 027/00 Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means

Event Publications

20 November 2003 Complete Application Filed

  Priority application(s): 102 34 507.4 24.07.02 DE

22 April 2004 Application Open to Public Inspection

  Published as AU-A-2003260246

26 May 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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