METHOD FOR CALIBRATION OF A PHOTODIODE, SEMICONDUCTOR CHIP AND OPERATING METHOD

Details for Australian Patent Application No. 2003258574 (hide)

Owner AUSTRIAMICROSYSTEMS AG

Inventors MUELLER, Thomas

Pub. Number AU-A-2003258574

PCT Number PCT/EP03/08665

PCT Pub. Number WO2004/021454

Priority 102 40 083.0 30.08.02 DE

Filing date 5 August 2003

Wipo publication date 19 March 2004

International Classifications

H01L 031/02 Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation - Details

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

H01L 027/144 Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate - Devices controlled by radiation

Event Publications

13 November 2003 Complete Application Filed

  Priority application(s): 102 40 083.0 30.08.02 DE

6 May 2004 Application Open to Public Inspection

  Published as AU-A-2003258574

19 May 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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