SYSTEM AND METHOD FOR SELFTESTING AND REPAIR OF MEMORY MODULES

Details for Australian Patent Application No. 2003258104 (hide)

Owner MICRON TECHNOLOGY, INC.

Inventors JEDDELOH, Joseph, M.

Pub. Number AU-A-2003258104

PCT Number PCT/US03/24605

PCT Pub. Number WO2004/017162

Priority 10/222,393 16.08.02 US

Filing date 5 August 2003

Wipo publication date 3 March 2004

Event Publications

13 November 2003 Complete Application Filed

  Priority application(s): 10/222,393 16.08.02 US

22 April 2004 Application Open to Public Inspection

  Published as AU-A-2003258104

19 May 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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