INTEGRATED CIRCUIT WITH BIT ERROR TEST CAPABILITY

Details for Australian Patent Application No. 2003255533 (hide)

Owner AGILENT TECHNOLOGIES, INC.

Inventors HEINEN, Martin; MOLL, Joachim

Pub. Number AU-A-2003255533

PCT Number PCT/EP03/50307

PCT Pub. Number WO2005/015251

Filing date 15 July 2003

Wipo publication date 25 February 2005

International Classifications

G01R 031/3185 Arrangements for testing electric properties

Event Publications

6 November 2003 Complete Application Filed

7 April 2005 Application Open to Public Inspection

  Published as AU-A-2003255533

30 March 2006 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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