DEVICE FOR WAFER INSPECTION

Details for Australian Patent Application No. 2003250961 (hide)

Owner LEICA MICROSYSTEMS SEMICONDUCTOR GMBH

Inventors BACKHAUSS, Henning

Pub. Number AU-A-2003250961

PCT Number PCT/EP03/07677

PCT Pub. Number WO2004/010114

Priority 102 32 781.5 18.07.02 DE

Filing date 16 July 2003

Wipo publication date 9 February 2004

International Classifications

G01N 021/00 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light

Event Publications

16 October 2003 Complete Application Filed

  Priority application(s): 102 32 781.5 18.07.02 DE

18 March 2004 Application Open to Public Inspection

  Published as AU-A-2003250961

14 April 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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