VARIABLE CLOCK SCAN TEST CIRCUITRY AND METHOD

Details for Australian Patent Application No. 2003248658 (hide)

Owner ON-CHIP TECHNOLOGIES, INC.

Inventors COOKE, Laurence, H.

Pub. Number AU-A-2003248658

PCT Number PCT/US03/18287

PCT Pub. Number WO2003/104828

Priority 60/387,683 11.06.02 US; 10/351,276 24.01.03 US

Filing date 11 June 2003

Wipo publication date 22 December 2003

International Classifications

G01R 031/28 Arrangements for testing electric properties - Testing of electronic circuits, e.g. by signal tracer

G06F 001/04 Details not covered by groups and - Generating or distributing clock signals or signals derived directly therefrom

G06F 001/06 Details not covered by groups and - Clock generators producing several clock signals

Event Publications

16 October 2003 Complete Application Filed

  Priority application(s): 60/387,683 11.06.02 US; 10/351,276 24.01.03 US

19 February 2004 Application Open to Public Inspection

  Published as AU-A-2003248658

7 April 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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