BUILT-IN-SELF-TEST OF FLASH MEMORY CELLS

Details for Australian Patent Application No. 2003243484 (hide)

Owner ADVANCED MICRO DEVICES, INC.

Inventors BILL, Colin, S.; HALIM, Azrul; HAMILTON, Darlene; BAUTISTA, Edward, V., Jr.; LEE, Weng, Fook; CHEAH, Ken, Cheong; LAW, Chee, Boon; TEH, Boon, Tang; KUCERA, Joseph; SALLEH, Syahrizal

Pub. Number AU-A-2003243484

PCT Number PCT/US03/18309

PCT Pub. Number WO2004/010437

Priority 10/200,540 22.07.02 US; 10/200,543 22.07.02 US; 10/200,544 22.07.02 US; 10/200,330 22.07.02 US; 10/200,518 22.07.02 US; 10/200,526 22.07.02 US; 10/200,538 22.07.02 US; 10/200,539 22.07.02 US

Filing date 10 June 2003

Wipo publication date 9 February 2004

International Classifications

G11C 029/00 Checking stores for correct operation

Event Publications

11 September 2003 Complete Application Filed

  Priority application(s): 10/200,540 22.07.02 US; 10/200,543 22.07.02 US; 10/200,544 22.07.02 US; 10/200,330 22.07.02 US; 10/200,518 22.07.02 US; 10/200,526 22.07.02 US; 10/200,538 22.07.02 US; 10/200,539 22.07.02 US

18 March 2004 Application Open to Public Inspection

  Published as AU-A-2003243484

7 April 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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