ELECTRONIC COMPONENT TEST INSTRUMENT

Details for Australian Patent Application No. 2003241977 (hide)

Owner ADVANTEST CORPORATION

Inventors ITO, Akihiko; YAMASHITA, Kazuyuki

Pub. Number AU-A-2003241977

PCT Number PCT/JP03/06835

PCT Pub. Number WO2004/106954

Filing date 30 May 2003

Wipo publication date 21 January 2005

International Classifications

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

Event Publications

11 September 2003 Complete Application Filed

10 February 2005 Application Open to Public Inspection

  Published as AU-A-2003241977

16 February 2006 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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