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Details for Australian Patent Application No. 2003241627 (hide)

Owner APPLIED MATERIALS, INC.

Inventors LEVIN, Evgeni; ALMOGY, Gilad; ROZENMAN, Efrat

Pub. Number AU-A-2003241627

PCT Number PCT/US03/16569

PCT Pub. Number WO2003/100404

Priority 10/155,255 22.05.02 US

Filing date 22 May 2003

Wipo publication date 12 December 2003

International Classifications

G01N 021/95 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light

H01L 021/66 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof - Testing or measuring during manufacture or treatment

G06T 007/00 Image analysis, e.g. from bit-mapped to non bit-mapped

Event Publications

11 September 2003 Complete Application Filed

  Priority application(s): 10/155,255 22.05.02 US

5 February 2004 Application Open to Public Inspection

  Published as AU-A-2003241627

24 February 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

18 August 2005 Corrigenda

  Applications OPI - Corrigenda Name Index Under the name APPLIED MATERIALS, INC., Application No. 2003241627, under INID (71) correct the name to read APPLIED MATERIALS, INC.; APPLIED MATERIALS ISRAEL, LTD.

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