INFRARED THERMOGRAPHY FOR DEFECT DETECTION AND ANALYSIS

Details for Australian Patent Application No. 2003236670 (hide)

Owner MARENA SYSTEMS CORPORATION

Inventors ENACHESCU, Marian; BELIKOV, Sergey

Pub. Number AU-A-2003236670

PCT Number PCT/US03/01905

PCT Pub. Number WO2003/062809

Priority 60/350,074 23.01.02 US; 60/350,055 23.01.02 US; Not Given 22.01.03 US

Filing date 22 January 2003

Wipo publication date 2 September 2003

International Classifications

G01N 025/72 Investigating or analysing materials by the use of thermal means - Investigating presence of flaws

G01R 031/02 Arrangements for testing electric properties - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

G01R 031/3183 Arrangements for testing electric properties

Event Publications

11 September 2003 Complete Application Filed

  Priority application(s): 60/350,074 23.01.02 US; 60/350,055 23.01.02 US; Not Given 22.01.03 US

18 September 2003 Application Open to Public Inspection

  Published as AU-A-2003236670

7 October 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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