SYSTEM FOR ALIGNING WAFERS AND FOR READING MICRO BARCODES AND MARKS ON CHIPS USING LASER

Details for Australian Patent Application No. 2003236212 (hide)

Owner CONSEJO SUPERIOR DE INVESTIGACIONES CIENTIFICAS

Inventors LOZANO FANTOBA, Manuel; PERELLO GARCIA, Carles; ENRICH SARD, Xavier; SANTANDER VALLEJO, Joaquin

Pub. Number AU-A-2003236212

PCT Number PCT/ES03/00207

PCT Pub. Number WO2003/098683

Priority P200201114 16.05.02 ES

Filing date 9 May 2003

Wipo publication date 2 December 2003

International Classifications

H01L 021/68 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

Event Publications

4 September 2003 Complete Application Filed

  Priority application(s): P200201114 16.05.02 ES

29 January 2004 Application Open to Public Inspection

  Published as AU-A-2003236212

3 February 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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