PROBE FOR TESTING A DEVICE UNDER TEST

Details for Australian Patent Application No. 2003233659 (hide)

Owner CASCADE MICROTECH, INC.

Inventors STRID, Eric; LESHER, Tim; ANDREWS, Mike; MARTIN, John; DUNKLEE, John; HAYDEN, Leonard; SAFWAT, Amr, M., E.

Pub. Number AU-A-2003233659

PCT Number PCT/US03/16322

PCT Pub. Number WO2003/100445

Priority 60/383,017 23.05.02 US

Filing date 23 May 2003

Wipo publication date 12 December 2003

International Classifications

G01R 001/06 Details of instruments or arrangements of the types included in groups and - Measuring leads

G01R 001/067 Details of instruments or arrangements of the types included in groups and - Measuring probes

Event Publications

28 August 2003 Complete Application Filed

  Priority application(s): 60/383,017 23.05.02 US

5 February 2004 Application Open to Public Inspection

  Published as AU-A-2003233659

10 February 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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