METHOD OF MASKING CORRUPT BITS DURING SIGNATURE ANALYSIS AND CIRCUIT FOR USE THEREWITH

Details for Australian Patent Application No. 2003230370 (hide)

Owner LOGICVISION, INC.

Inventors NADEAU-DOSTIE, Benoit

Pub. Number AU-A-2003230370

PCT Number PCT/US03/14724

PCT Pub. Number WO2003/104827

Priority 10/162,917 06.06.02 US

Filing date 12 May 2003

Wipo publication date 22 December 2003

International Classifications

G01R 031/28 Arrangements for testing electric properties - Testing of electronic circuits, e.g. by signal tracer

Event Publications

14 August 2003 Complete Application Filed

  Priority application(s): 10/162,917 06.06.02 US

19 February 2004 Application Open to Public Inspection

  Published as AU-A-2003230370

24 February 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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