CRYSTALLOGRAPHIC METROLOGY AND PROCESS CONTROL

Details for Australian Patent Application No. 2003225728 (hide)

Owner AGERE SYSTEMS, INC.

Inventors STEVIE, F., A.; HOUGE, Erik, C.; KEMPSHALL, Brian; SCHWARTZ, Steve

Pub. Number AU-A-2003225728

PCT Number PCT/US03/07264

PCT Pub. Number WO2003/073481

Priority 60/359,222 22.02.02 US

Filing date 24 February 2003

Wipo publication date 9 September 2003

International Classifications

H01L 021/00 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Event Publications

7 August 2003 Complete Application Filed

  Priority application(s): 60/359,222 22.02.02 US

16 October 2003 Application Open to Public Inspection

  Published as AU-A-2003225728

23 October 2003 Application Open to Public Inspection

  Published as AU-A-2003225728

9 December 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

Legal

The information provided by the Site not in the nature of legal or other professional advice. The information provided by the Site is derived from third parties and may contain errors. You must make your own enquiries and seek independent advice from the relevant industry professionals before acting or relying on any information contained herein. Check the above data against the Australian Patent Office AUSPAT database.

Next and Previous Patents/Applications

2003225729-SEALING METHOD

2003225727-COMPOUNDS THAT MODULATE PROCESSES ASSOCIATED WITH IgE PRODUCTION AND METHODS AND KITS FOR IDENTIFYING AND USING THE SAME