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Details for Australian Patent Application No. 2003223446 (hide)

Owner INTEGRATED NANOSYSTEMS, INC.

Inventors CASSELL, Alan, M.; HAN, Jie; STEVENS, Ramsey, M.

Pub. Number AU-A-2003223446

PCT Number PCT/US03/10304

PCT Pub. Number WO2003/087709

Priority 11/117,822 05.04.02 US

Filing date 2 April 2003

Wipo publication date 27 October 2003

International Classifications

G01B 007/34 Measuring arrangements characterised by the use of electric or magnetic means - for measuring roughness or irregularity of surfaces

Event Publications

7 August 2003 Complete Application Filed

  Priority application(s): 11/117,822 05.04.02 US

4 December 2003 Application Open to Public Inspection

  Published as AU-A-2003223446

23 December 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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