METHOD AND SYSTEM FOR DETECTING DEFECTS

Details for Australian Patent Application No. 2003223168 (hide)

Owner APPLIED MATERIALS, INC.

Inventors SARIG, Nimrod

Pub. Number AU-A-2003223168

PCT Number PCT/US03/03490

PCT Pub. Number WO2003/067520

Priority 10/072,313 07.02.02 US

Filing date 4 February 2003

Wipo publication date 2 September 2003

International Classifications

G06T 007/00 Image analysis, e.g. from bit-mapped to non bit-mapped

Event Publications

7 August 2003 Complete Application Filed

  Priority application(s): 10/072,313 07.02.02 US

25 September 2003 Application Open to Public Inspection

  Published as AU-A-2003223168

2 December 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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