METHOD AND SYSTEM FOR GRAPHICAL EVALUATION OF IDDQ MEASUREMENTS

Details for Australian Patent Application No. 2003217688 (hide)

Owner RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY

Inventors RAO, Lan; BUSHNELL, Michael

Pub. Number AU-A-2003217688

PCT Number PCT/US03/05582

PCT Pub. Number WO2003/073114

Priority 60/378,067 16.05.02 US; 60/358,366 22.02.02 US; 60/378,044 16.05.02 US

Filing date 24 February 2003

Wipo publication date 9 September 2003

International Classifications

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

G01R 031/28 Arrangements for testing electric properties - Testing of electronic circuits, e.g. by signal tracer

G01R 031/02 Arrangements for testing electric properties - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection

G01R 001/04 Details of instruments or arrangements of the types included in groups and

Event Publications

31 July 2003 Complete Application Filed

  Priority application(s): 60/378,067 16.05.02 US; 60/358,366 22.02.02 US; 60/378,044 16.05.02 US

16 October 2003 Application Open to Public Inspection

  Published as AU-A-2003217688

11 November 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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