ELECTRONIC COMPONENT CHARACTERISTIC MEASURING DEVICE

Details for Australian Patent Application No. 2003211893 (hide)

Owner MURATA MANUFACTURING CO., LTD.

Inventors SASAOKA, Yoshikazu

Pub. Number AU-A-2003211893

PCT Number PCT/JP03/02826

PCT Pub. Number WO2003/091739

Priority 2002-123710 25.04.02 JP

Filing date 11 March 2003

Wipo publication date 10 November 2003

International Classifications

G01R 031/00 Arrangements for testing electric properties

H01L 021/66 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof - Testing or measuring during manufacture or treatment

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

G01R 027/00 Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

H01G 013/00 Apparatus specially adapted for manufacturing capacitors

Event Publications

24 July 2003 Complete Application Filed

  Priority application(s): 2002-123710 25.04.02 JP

18 December 2003 Application Open to Public Inspection

  Published as AU-A-2003211893

13 January 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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