Assembly and method for wavelength calibration in an echelle spectrometer

Details for Australian Patent Application No. 2003210190 (hide)

International Classifications

Event Publications

17 July 2003 Complete Application Filed

Priority application(s): 102 05 142.9 07.02.02 DE

25 September 2003 Application Open to Public Inspection

Published as AU-B-2003210190

21 September 2006 Change of Name(s) of Applicant(s), Section 104

Gesellschaft Zur Forderung Angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie E.V.; Gesellschaft Zur Forderung Der Spektrocheme und Angewandten Spektroskopie E.V The name of the applicant has been changed to Gesellschaft Zur Forderung Angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie E.V.; Gesellschaft Zur Forderung Der Analytischen Wissenschaften E.V

26 June 2008 Application Accepted

Published as AU-B-2003210190

23 October 2008 Standard Patent Sealed

2 February 2012 Assignment Registered

Gesellschaft Zur Forderung Angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V.; Gesellschaft Assignments Registered Zur Forderung Der Analytischen Wissenschaften e.V The patent has been assigned to Gesellschaft zur Forderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V.; Gesellschaft Zur Forderung Angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V.

16 August 2012 Assignment Registered

Gesellschaft zur Forderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V. The pat- Assignments Registered ent has been assigned to Leibniz - Institut fur Analytische Wissenschaften - ISAS-e.V.

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