METHOD AND DEVICE FOR OPTICALLY TESTING SEMICONDUCTOR ELEMENTS

Details for Australian Patent Application No. 2003205413 (hide)

Owner GORNIK, Erich POGANY, Dionyz INNOVATIONSAGENTUR GESELLSCHAFT M.B.H.

Inventors GORNIK, Erich; POGANY, Dionyz

Pub. Number AU-A-2003205413

PCT Number PCT/AT03/00018

PCT Pub. Number WO2003/062844

Priority A 124/2002 25.01.02 AT

Filing date 20 January 2003

Wipo publication date 2 September 2003

International Classifications

G01R 031/308 Arrangements for testing electric properties

G01R 031/302 Arrangements for testing electric properties

G01N 021/17 Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light - Systems in which incident light is modified in accordance with the properties of the material investigated

G01R 031/311 Arrangements for testing electric properties

Event Publications

17 July 2003 Complete Application Filed

  Priority application(s): A 124/2002 25.01.02 AT

18 September 2003 Application Open to Public Inspection

  Published as AU-A-2003205413

14 October 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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