VERIFICATION OF EMBEDDED TEST STRUCTURES IN CIRCUIT DESIGNS

Details for Australian Patent Application No. 2003205268 (hide)

Owner LOGICVISION, INC.

Inventors PRICE, Paul; COTE, Jean-Francois; VERMA, Ajit, Kumar

Pub. Number AU-A-2003205268

PCT Number PCT/US03/01830

PCT Pub. Number WO2003/067478

Priority 60/354,016 05.02.02 US

Filing date 23 January 2003

Wipo publication date 2 September 2003

International Classifications

G06F 017/50 Digital computing or data processing equipment or methods, specially adapted for specific functions - Computer-aided design

Event Publications

17 July 2003 Complete Application Filed

  Priority application(s): 60/354,016 05.02.02 US

25 September 2003 Application Open to Public Inspection

  Published as AU-A-2003205268

21 October 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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