HIGH-PRECISION MEASURING METHOD FOR OBJECT TO BE MEASURED BY LASER REFLECTION BEAM AND DEVICE THEREFOR

Details for Australian Patent Application No. 2003201920 (hide)

Owner KABUSHIKI KAISHA TOYOSEIKISEISAKUSHO

Inventors KOBAYASHI, Kouichi

Pub. Number AU-A-2003201920

PCT Number PCT/JP03/00299

PCT Pub. Number WO2003/087711

Priority 2002-9940 18.01.02 JP

Filing date 16 January 2003

Wipo publication date 27 October 2003

International Classifications

G01B 011/00 Measuring arrangements characterised by the use of optical means

G01B 011/16 Measuring arrangements characterised by the use of optical means - for measuring the deformation in a solid, e.g. optical strain gauge

Event Publications

3 April 2003 Complete Application Filed

  Priority application(s): 2002-9940 18.01.02 JP

4 December 2003 Application Open to Public Inspection

  Published as AU-A-2003201920

7 October 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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