ELECTRONIC DEVICE TEST SYSTEM

Details for Australian Patent Application No. 2002368120 (hide)

Owner ADVANTEST CORPORATION

Inventors SAITO, Noboru

Pub. Number AU-A-2002368120

PCT Number PCT/JP2002/0077

PCT Pub. Number WO2004/011952

Filing date 30 July 2002

Wipo publication date 16 February 2004

International Classifications

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

Event Publications

11 March 2004 Complete Application Filed

25 March 2004 Application Open to Public Inspection

  Published as AU-A-2002368120

21 July 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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