PATTERN FOR IMPROVED VISUAL INSPECTION OF SEMICONDUCTOR DEVICES

Details for Australian Patent Application No. 2002360265 (hide)

Owner CREE, INC.

Inventors SLATER, David, B., Jr.; NEGLEY, Gerald, H.; SCHNEIDER, Thomas, P.; TUTTLE, Ralph, C.; PLUNKET, Christopher, Sean

Pub. Number AU-A-2002360265

PCT Number PCT/US02/32320

PCT Pub. Number WO2003/036718

Priority 10/045,766 23.10.01 US

Filing date 10 October 2002

Wipo publication date 6 May 2003

International Classifications

H01L 023/544 Details of semiconductor or other solid state devices - Marks applied to semiconductor devices, e.g. registration marks, test patterns

Event Publications

3 April 2003 Complete Application Filed

  Priority application(s): 10/045,766 23.10.01 US

3 July 2003 Application Open to Public Inspection

  Published as AU-A-2002360265

8 July 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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