POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN FROM THE SAME

Details for Australian Patent Application No. 2002354248 (hide)

Owner TOKYO OHKA KOGYO CO., LTD.

Inventors IWAI, Takeshi; KUBOTA, Naotaka; FUJIMURA, Satoshi; MIYAIRI, Miwa; HADA, Hideo

Pub. Number AU-A-2002354248

PCT Number PCT/JP02/12524

PCT Pub. Number WO2003/048861

Priority 2001/382126 14.12.01 JP; 2002/201310 10.07.02 JP; 2001/369341 03.12.01 JP

Filing date 29 November 2002

Wipo publication date 17 June 2003

International Classifications

G03F 007/039 Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces - Macromolecular compounds which are photodegradable, e.g. positive electron resists

H01L 021/027 Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Event Publications

20 March 2003 Complete Application Filed

  Priority application(s): 2001/382126 14.12.01 JP; 2002/201310 10.07.02 JP; 2001/369341 03.12.01 JP

21 August 2003 Application Open to Public Inspection

  Published as AU-A-2002354248

19 August 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

Legal

The information provided by the Site not in the nature of legal or other professional advice. The information provided by the Site is derived from third parties and may contain errors. You must make your own enquiries and seek independent advice from the relevant industry professionals before acting or relying on any information contained herein. Check the above data against the Australian Patent Office AUSPAT database.

Next and Previous Patents/Applications

2002354249-POWER CONVERTERS WITH PRIMARY-ONLY FEEDBACK

2002354247-SCREENING METHOD