FORCE SCANNING PROBE MICROSCOPE

Details for Australian Patent Application No. 2002351260 (hide)

Owner VEECO INSTRUMENTS, INC.

Inventors STRUCKMEIER, Jens; GOTTHARD, Doug; OHLER, Ben

Pub. Number AU-A-2002351260

PCT Number PCT/US02/39012

PCT Pub. Number WO2003/050821

Priority 10/006,085 06.12.01 US

Filing date 6 December 2002

Wipo publication date 23 June 2003

International Classifications

G12B 021/22

G12B 021/02

H02N 002/04 Electric machines in general using piezo-electric effect, electrostriction or magnetostriction

G01B 007/34 Measuring arrangements characterised by the use of electric or magnetic means - for measuring roughness or irregularity of surfaces

G01L 005/00 Apparatus for, or methods of, measuring force, e.g. due to impact, work, mechanical power, or torque, adapted for special purposes

Event Publications

20 March 2003 Complete Application Filed

  Priority application(s): 10/006,085 06.12.01 US

28 August 2003 Application Open to Public Inspection

  Published as AU-A-2002351260

26 August 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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