METHOD AND APPARATUS FOR MICROMACHINES, MICROSTRUCTURES, NANOMACHINES AND NANOSTRUCTURES

Details for Australian Patent Application No. 2002346559 (hide)

Owner GENERAL NANOTECHNOLOGY LLC

Inventors KLEY, Victor, B.

Pub. Number AU-A-2002346559

PCT Number PCT/US02/38036

PCT Pub. Number WO2003/046473

Priority 60/334,181 28.11.01 US; 10/305,776 26.11.02 US

Filing date 27 November 2002

Wipo publication date 10 June 2003

International Classifications

G01B 005/28 Measuring arrangements characterised by the use of mechanical means - for measuring roughness or irregularity of surfaces

Event Publications

13 March 2003 Complete Application Filed

  Priority application(s): 60/334,181 28.11.01 US; 10/305,776 26.11.02 US

21 August 2003 Application Open to Public Inspection

  Published as AU-A-2002346559

12 August 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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